000 00479nam a2200181Ia 4500
008 180424s9999 xx 000 0 und d
020 _a471790206
084 _a535.332 5 S1
100 _a"Siegel, Benjamin M"
245 0 _aPhysical Aspects of Electron Microscopy and Microbeam Analysis
250 _a\\197500ENGGPSX
260 _aJohn Wiley
260 _b1975
260 _cNew York
300 _axiii+474 p
500 _aincludes index and biblioraphy
942 _cBK
999 _c38630
_d38630