| 000 | 00479nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 180424s9999 xx 000 0 und d | ||
| 020 | _a471790206 | ||
| 084 | _a535.332 5 S1 | ||
| 100 | _a"Siegel, Benjamin M" | ||
| 245 | 0 | _aPhysical Aspects of Electron Microscopy and Microbeam Analysis | |
| 250 | _a\\197500ENGGPSX | ||
| 260 | _aJohn Wiley | ||
| 260 | _b1975 | ||
| 260 | _cNew York | ||
| 300 | _axiii+474 p | ||
| 500 | _aincludes index and biblioraphy | ||
| 942 | _cBK | ||
| 999 |
_c38630 _d38630 |
||