| 000 | 00449nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 180424s9999 xx 000 0 und d | ||
| 020 | _a486622150 | ||
| 084 | _a535.66 T2 | ||
| 100 | _a"Tolansky, S" | ||
| 245 | 0 | _aMultiple-Beam Interferometry of Surfaces and Films | |
| 250 | _a\\197000ENGGPSX | ||
| 260 | _aDover | ||
| 260 | _b1970 | ||
| 260 | _cNewyork | ||
| 300 | _avi+186 p | ||
| 500 | _aincludes index and biblioraphy | ||
| 942 | _cBK | ||
| 999 |
_c26784 _d26784 |
||