000 00416nam a2200145Ia 4500
008 180713s9999 xx 000 0 und d
082 _a621.395 W5
100 _a"Wang, Laung-Terng "
245 0 _aVLSI Test Principles and Architectures
260 _aNoida
260 _b India Sheel
260 _c2011
365 _b500
942 _cBK
999 _c114169
_d114169